
Reflectometer Holmarc
388000 INR/Piece
Minimum Order Quantity : 1 Units
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Minimum Order Quantity : 1 Units
Usage Laboratory, industrial
Test Width Up to 100 mm
Test Stroke 0 - 50 mm
Test Speed Variable, 1 - 100 mm/min
Test Range Reflectance 0 - 100%
Temperature Ambient, 10A C - 40A C
Specimen Size 15 mm to 100 mm diameter
Response Time <1 second
Resolution 0.01%
Power Supply 230V AC, 50 Hz
Port Size Standard 2 optical port
Operating Voltage 230V AC
Number of Specimens Single specimen per test
Mounting Type Bench-top
Measuring Range 0 - 100% reflectance
Max Height 150 mm
Machine Weight 25 kg
Interface Type USB, RS232
Humidity Up to 80% RH
Frequency 50 Hz
Features High precision, software data acquisition
Display Type Digital LCD
Control Mode Manual / Automatic
Capacity Up to 2 kg sample holder
Automation Grade Semi-automatic
Application Measurement of reflectance of coated/uncoated surfaces
Accuracy A 1%
<b>Equipment Type</b> Reflectometer
Payment Terms Cash in Advance (CID), Cash in Advance (CID)
Main Export Market(s) Asia, Middle East, Africa
Main Domestic Market All India, All India
Thin film spectroscopic reflectometer is a fundamental instrument used for the analysis of thin film thickness in industry and research. Holmarcs tfsr model is able to analyze thin films thickness, complex refractive index and surface roughness with high speed and repeatability. Tfsr theory works with complex matrix form of fresnel equations for reflectance and transmittance. Absolute reflectance spectroscopy is the principle behind reflectometer; which is the ratio of the intensity of the reflected light beam (usually monochromatic) to the intensity of the incident beam.
Light beam normally incident on the sample surface in turn reflect from top and bottom of the thin film surfaces which get interfered and is directed through optical fiber to ccd attached spectrometer via computer. On the monitor we get spectrogram with interference oscillations directly proportional to the thin film thickness.
Holmarcs reflectometer can be used to analyze single, multi-layer, free standing and rough layer thickness of various stacks such as di-electric, crystalline, amorphous, metallic and absorbing samples. It also finds absolute transmittance and absorption directly. Roughness treatment is done with ema modeling. The instrument can also be used to find optical conductivity, molar refractivity and brewsters angle of sample under study.
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Delivery Time : 30-45 Days
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